Japan Novel is participating in 8th DATA CENTER EXPO Spring
The problem-solving tips for operation and management efficiency of the data center are here!
Japan Novel is attending to "2016 Japan IT Week Spring" which will be held at Tokyo Big Sight. We will be exhibiting at Anywire Corporation booth. We are planning the exhibition to be such as helpful to operational management efficiency of the data center including showing the latest version of iDCNavi which is the data center environment monitoring system.
Please come visit to our booth and see our new solutions. We are looking forward to seeing you at the show.
Exhibition Overview
- Exhibition Title
- 2016 Japan IT Week Spring - DATA CENTER EXPO
- Schedule
- May 11 (Wed) - 13 (Fri), 2016 10:00～18:00
Last day until 17:00 - Venue
- Tokyo Big Sight
- Booth Position
-
East Exhibition Hall, East 31-3
* We will be exhibiting at Anywire Corporation booth.
Also attending to IoT/M2M EXPO at West Exhibition Hall
- Organizer
- Reed Exhibitions Japan Ltd.
- Official Site
- DATA CENTER EXPO
http://www.dc-expo.jp/ - Tickets
- Please ask our sales for the tickets.
(Or you can apply at the official site of the exhibition.)
Exhibited Products& Services
Data center environment monitoring system - iDCNavi
Visualization of temperature or current in server room
iDCNavi is a system for measuring and monitoring such as temperature and current of the data center. By monitoring the multi-point data in real-time measurement continuously, early detection of abnormalities and determination of cause can be performed. In addition, the energy saving due to efficient cooling can be expected by utilizing the collected data.
Server rack management system - UnitPORTER.Navi
Visualization of the "contents" of server racks
UnitPORTER.Navi is a WEB system that can do integrated management for variety of information of the equipments in server racks. It can contribute significantly to the safety and energy-saving and is suitable for state monitoring of server racks installed at remote site since it can get and utilize not only specification information such as each instrument's specs, OS support deadline or installation date, but environmental information such as current and temperature data from measuring sensors.